With the completely automatic self-alignment system, a complex and long-lasting operator-related changeovers and set-up times are no longer required. New products can be introduced faster and easier than ever before. Due to the new construction, the inspection system with latest IR technology on sidewall and backside inspection reaches an even higher output quality. A more intuitive software interface and an enhanced wafer handling complete this brand new die sorting system.
Advantages
High speed Wafer-to-Wafer machine (up to 25.000 to over 40.000 UPH)
12” wafer reconstruction or panel size up to 24” x24” (600x 600 mm)
Flip or Non-flip capability
100% Vision Inspection
Simple process Wafer-to-Wafer / Wafer-to-Panel / jedec tray
» Ready for ultra small die handling 0.2 x 0.4 mm
Best compromise between speed and accuracy improvement
Benifits
Including flip chip and 100% 6-side inspection
» Defect detection of 9µm defects and 5µm on sidewall
» Infrared: sidewall and backside IR inspection (down to 5 µm)
High placement accuracy ±20 µm - ±15 µm (optional)
100% traceability with MB PalaMax®